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ABOUT THE BOOK

Written by one of the very first practitioners of ICP-MS, Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way. By comparing it with other complementary atomic spectroscopy (AS) techniques, it gives the trace element analysis user community a glimpse into why the technique was first developed and how the application landscape has defined its use today, 40 years after it was first commercialized in 1983.

What’s new in the 4th edition:

• Updated chapters on the fundamental principles and applications of ICP-MS
• New chapters on complementary AS techniques including AA, AF, ICP-OES, MIP-AES, XRF, XRD, LIBS, LALI-TOFMS
• Strategies for reducing errors and contamination with plasma spectrochemical techniques
• Comparison of collision and reaction cells including triple/multi quad systems
• Novel approaches to sample digestion
• Alternative sample introduction accessories
• Comprehensive glossary of terms used in AS
• New vendor contact information

The book is not only suited to novices and beginners, but also to more experienced analytical scientists who want to know more about recent ICP-MS developments, and where the technique might be heading in the future. Furthermore, it offers much needed guidance on how best to evaluate commercial AS instrumentation and what might be the best technique, based on your lab’s specific application demands.

"I feel honored to have been asked to deliver the Foreword for this book, which is suited not only for beginners, but also for more experienced analytical scientists who want to know the advances in plasma spectrochemistry instrumentation and related future opportunities."

-Dr. Heidi Goenaga Infante, LGC Science Fellow; Chief Scientist, National Measurement Laboratory, Visiting Professor, University of Strathclyde, UK.

TABLE OF CONTENTS

Contents

Foreword

Preface

Acknowledgements

About the Author

Chapter 1: An Overview of ICP Mass Spectrometry

Chapter 2: Principles of Ion Formation

Chapter 3: Sample Introduction

Chapter 4: Plasma Source

Chapter 5: Interface Region

Chapter 6: Ion Focusing System

Chapter 7: Mass Analyzers: Quadrupole Technology

Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology

Chapter 9: Mass Analyzers: Time-Of-Flight Technology

Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface Technology

Chapter 11: Ion Detectors

Chapter 12: Peak Measurement Protocol

Chapter 13: Methods of Quantitation

Chapter 14: Review of ICP-MS Interferences

Chapter 15: Routine Maintenance

Chapter 16: Sampling and Sample Preparation Procedures

Chapter 17: A Practical Guide to Reducing Errors and Contamination Using Plasma Spectrochemistry

Chapter 18: Performance- and Productivity-Enhancement Techniques

Chapter 19: Coupling ICP-MS with Chromatographic Separation Techniques for Speciation Studies

Chapter 20: Overview of the ICP-MS Application Landscape

Chapter 21: Fundamental Principles and Applications of Atomic Absorption and Atomic Fluoresence

Chapter 22: Fundamental Principles, Method Development and Operational Requirements of ICP-Optical Emission Spectroscopy

Chapter 23: Other Complementary Atomic Spectroscopy Techniques

Chapter 24: Performance Characteristics of Common Atomic Spectroscopy Techniques

Chapter 25: Running Costs of Common AS Techniques

Chapter 26: How to Evaluate an ICP Mass Spectrometer: Some Important Analytical Considerations

Chapter 27: Glossary of Terms Used in Atomic Spectroscopy

Chapter 28: Useful Contact Information